Functional Level Primitives in Test Generation

Abstract

This paper deals with the use and development of high-level (functional) primitive logic elements for use in a system which automatically generates tests for complex sequential circuits. The concept of solution sequences to test problems for primitive elements is introduced and a functional language used to describe solution sequences is presented. Functional test generation models for two basic elements, a shift register and a counter, are derived, including procedures for implication, D-drive and line justification. Primitive algorithms which generate single as well as multivector (sequences) solutions to D-drive and line justification problems are presented.