Abstract

A fully/partially suspended gate can overcome the issue of low channel mobility due to interface traps at the Silicon Carbide (SiC) and Silicon Dioxide (SiO 2 ) interface of a SiC-based DMOS. TCAD simulations (with a deck calibrated to experimental data for SiC) confirms that a suspended gate structure with Air or hybrid dielectrics (stack of Air and SiO 2 ) provides substantial performance enhancement. The device design (Dielectric spacing) is optimized via simulations. With experimentally reported densities of interface traps the output current indicate that they have a negligible effect on the device performance.

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