Fully Probe Corrected Spherical Near Field Measurements with Arbitrary Offset and Minimum Sampling using the Translated-SWE Algorithm

Abstract

Radiating tests of modern antenna systems require large bandwidth, high accuracy and short measurement time. Spherical Near Field measurements are a very accurate and well-established testing methodology but, in case of electrically large Device Under Test (DUT), they might require long acquisition time due to the large number of samples to be measured [1]. The Translated Spherical Wave Expansion (TSWE) is a very effective Near-Field-to-Far-Field (NF/FF) transformation technique which can be involved in case of offset antennas to reduce the number of samples [2]. In [3] it has been shown how the TSWE can be combined with full Probe Compensation (PC) [4] allowing the use of wideband higher order antennas as probe without loss of accuracy. Such approach was in that case validated for antennas offset along the z-axis. In this contribution instead, the validation is extended in case of arbitrary offset of the DUT.