Abstract
Digital aberration measurement and removal play a prominent role in computational imaging platforms aimed at achieving simple and compact optical arrangements. A recent important class of such platforms is Fourier ptychography (FP), which is geared toward efficiently creating gigapixel images with high resolution and large field of view (FOV). In current FP implementations, pupil aberration is often recovered at each small segment of the entire FOV. This reconstruction strategy fails to consider the field-dependent nature of the optical pupil. Given the power series expansion of the wavefront aberration, the spatially varying pupil can be fully characterized by tens of coefficients over the entire FOV. With this observation, we report a Full-field Fourier Ptychography (FFP) scheme for rapid and robust aberration metrology. The meaning of “full-field” in FFP is referred to the recovery of the “full-field” coefficients that govern the field-dependent pupil over the entire FOV. The optimization degrees of freedom are at least two orders of magnitude lower than the previous implementations. We show that the image acquisition process of FFP can be completed in ∼1 s and the spatially varying aberration of the entire FOV can be recovered in ∼35 s using a central processing unit. The reported approach may facilitate the further development of FP. Since no moving part or calibration target is needed in this approach, it may find important applications in aberration metrology. The derivation of the full-field coefficients and its extension for Zernike modes also provide a general tool for analyzing spatially varying aberrations in computational imaging systems.
Highlights
Characterization of spatially varying wavefront aberration is of critical importance in ophthalmology, microscopy, astronomy, photography, and lithography
A recent important class of such platforms is Fourier ptychography (FP),16–27 which is geared toward efficiently creating gigapixel images with high resolution over a large scitation.org/journal/app field-of-view (FOV)
We report a Full-field Fourier Ptychography (FFP) scheme for rapid and robust aberration metrology
Summary
Characterization of spatially varying wavefront aberration is of critical importance in ophthalmology, microscopy, astronomy, photography, and lithography. A spatially varying probe beam can be recovered using an orthogonal relaxation approach.15 Among these different implementations, digital aberration measurement and removal play an especially prominent role in computational imaging platforms aimed at achieving simple and compact optical arrangements. At the end of the FP reconstruction process, the synthesized information in the Fourier domain generates a higher resolution complex object image that retains the original large FOV set by the low-NA objective. The derivation of the full-field power series coefficients and its extension for Zernike modes provide a general tool for analyzing spatially varying aberrations in computational imaging systems
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.