Abstract
Based on the equivalence theorem of a unitary optical system, we proposed an analytical approach to characterize the cell parameters of a twisted nematic liquid-crystal device (TNLCD) with full-field resolution. The spatial distribution of three characteristic parameters of a TNLCD was measured by using a polarizer-sample-analyzer imaging polarimeter so that the untwisted phase retardation, cell thickness, and twisted angle of a TNLCD can be directly calculated through the explicit expressions as a function of the characteristic parameters. The measured results agree well with the given values. This method can be implemented for characterization of a TNLCD in the manufacturing process.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
