Full k-space visualization of photoelectron diffraction

Abstract

The development of photoelectron holography has promoted the need for larger photoelectron diffraction data sets in order to improve the quality of real-space reconstructed images (by suppressing transformational artifacts and distortions). The two main experimental and theoretical approaches to holography, the transform of angular distribution patterns for a coarse selection of energies or the transform of energy-scanned profiles for several directions, represent two limits to k-space sampling. The high brightness of third-generation soft x-ray synchrotron sources provides the opportunity to rapidly measure large high-density x-ray photoelectron diffraction (XPD) data sets with approximately uniform k-space sampling. In this abstract, the authors present such a photoelectron data set acquired for Cu 3p emission from Cu(001). Cu(001) is one of the most well-studied systems for understanding photoelectron diffraction structure and for testing photoelectron holography methods. Cu(001) was chosen for this study in part due to the relatively inert and unreconstructed clean surface, and it served to calibrate and fine-tune the operation of a new synchrotron beamline, electron spectrometer and sample goniometer. In addition to Cu, similar 'volume' XPD data sets have been acquired for bulk and surface core-level emission from W(110), from reconstructed Si(100) and Si(111) surfaces, and from the adsorbate system ofmore » c(2x2) Mn/Ni(100).« less