Full field retardation measurement of birefringent samples

Abstract

This work aims to characterize the retardation of birefringent samples such as wave-plates and birefringent wedges where the principal axis is uniform over the sample zone. The in-line procedure described and implemented for the purpose uses four frames of intensity data that are digitally recorded and combined to characterize the sample in terms of its retardance from 0 to 2π as also to uniquely identify the direction of its fast axis. Simulated and experimental results presented are in good agreement with the proposed theory.