Abstract
A novel bidirectional thickness profilometer based on transmission densitometry was designed to measure the localized thickness of semitransparent films on a dynamic manufacturing line. The densitometer model shows that, for materials with extinction coefficients between 0.3 and 2.9?D/mm, 100-500microm measurements can be recorded with less than +/-5% error at more than 10,000 locations in real time. As a demonstration application, the thickness profiles of 75mmx100?mm regions of polymer electrolyte membrane (PEM) were determined by converting the optical density of the sample to thickness with the Beer-Lambert law. The PEM extinction coefficient was determined to be 1.4D/mm, with an average thickness error of 4.7%.
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