Abstract
The origin of the large background photoemission of activated H-erionites was investigated by DRIFT, Raman, and Fourier-transform near-infrared ( FT n.i.r.) Raman spectroscopy. The strength of the background photoemission is closely related to the acid strength of the H-zeolite. It could be shown by FT n.i.r. Raman spectroscopy that in spite of this relation the photoemission is not an intrinsic property of the H zeolite. A special technique was developed in order to study activated zeolites in sealed glass tubes by DRIFT spectroscopy. Identification as well as semiquantitative determination of low concentrated constituents are feasible by this technique
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