Frontal IBICC study of the induced proton radiation damage in CdTe detectors

Abstract

Within a continuous international effort in developing the non-cryogenic semiconductor detectors for gamma ray spectroscopy, various wide gap materials were considered. With a best performance achieved, CdTe- and CdZnTe-based detectors become today widely accepted and commercially available. In addition to possible future use of such detectors for particle-induced gamma-ray emission (PIGE), nuclear microprobes are in recent years applied more as their characterisation tool using the ion beam-induced charge collection (IBICC) technique. Several CdTe detectors of 2×2×1 mm 3 size were used in this study. On the basis of frontal IBICC measurements of the charge collection efficiency (CCE) distribution, the spectroscopy performance of detectors were measured. Further degradation of charge collection efficiency and the downward trend in peak position were studied by on-line irradiation of CdTe samples with 3 MeV protons up to 10 10 p/cm 2 radiation dose.