Front-side releasing oriented clamped–clamped beams for piezoresistive sensors

Abstract

Front-side releasing suspended structures made using bulk micromachining processes have the advantages of simplifying vacuum or hermetic packaging processes and reducing squeeze-film damping. This paper studies the effect of doping concentration on the etching rate (ER) of the (111) plane. The experimental results show that increasing the boron doping concentration (but to less than the self-stop etching concentration) significantly increases the ER of the (111) plane and the ER ratio of the (111) and (100) planes. This phenomenon is used to speed up the undercutting and release <110> oriented clamped–clamped beams, which can be used as piezoresistive sensitive elements. The etching depth when the microbeams have just been released and the silicon wedges under single beams, double beams and triple beams disappear is deduced and verified by experiments. This has a certain guiding significance for designing piezoresistive sensors.