Abstract
A reflectional quantitative differential phase microscopy (RQDPM) based on polarized wavefront phase modulation and partially coherent full‐aperture illumination is introduced for imaging thick and opaque samples. RQDPM utilizes the polarization‐dependent characteristic of a phase‐type spatial light odulator to divide the object wave into two identical copies with a certain shear distance. When loading different modulation images to the spatial light modulator, phase derivative images with different shearing directions and phase shifts can be obtained. Finally, the phase distribution of the sample is obtained.For further details please visit the article by Ying Ma, Taiqiang Dai, Lan Yu, Lin Ma, Sha An, Yang Wang, Min Liu, Juanjuan Zheng, Liang Kong, Chao Zuo, and Peng Gao (e202200325).image
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