Abstract
In article number 2100083, Arthur Leis, Bert Voigtländer and co-workers demonstrate nanoscale four-probe measurements on atomically thin topological insulator films. For this purpose, four individual scanning tunneling microscope tips are directly contacting individual terraces on the sample surface to quantify the thickness-dependent film conductivity. This enables the authors to detect a breakdown of spin-momentum locking in the topological surface state as a function of the film thickness. In the few-layer limit, this effect can realize helical edge modes along step edges with potential applications in spintronics and quantum computing.
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