From Ideal to Stack-like Contacting of an SOC

Abstract

The performance of an SOC depends on the testing environment. Regarding single cell tests with ideal contacting (gold and nickel meshes) and inert flow fields (Al2O3), the performance is limited by the intrinsic losses in the cell as contact losses and any poisoning effects are minimized. In an SOC-stack exhibiting metallic interconnectors, the performance is furthermore affected by contact resistances and limitations in gas supply. In this contribution single cell testing is extended to a stack-like contacting applying three different metallic interconnectors (Crofer 22 APU, ASTM 441 and UNS S44330) with and without a cerium-cobalt PVD-coating. Cell performance and losses are analyzed by IV-characteristics, impedance spectroscopy and DRT analysis. For all uncoated interconnectors, significant performance losses due to increased contact losses and air electrode polarization were observed. With the CeCo-coating losses could be drastically reduced leading to a cell performance close to the ideal case for all three steel grades.