Abstract
Problems in computational finance share many of the characteristics that challenge us in statistical circuit analysis: high dimensionality, profound nonlinearity, stringent accuracy requirements, and expensive sample simulation. We offer a detailed experimental study of how one celebrated technique from this domain - quasi-Monte Carlo (QMC) analysis - can be used for fast statistical circuit analysis. In contrast with traditional pseudo-random Monte Carlo sampling, QMC substitutes a (shorter) sequence of deterministically chosen sample points. Across a set of digital and analog circuits, in 90nm and 45nm technologies, varying in size from 30 to 400 devices, we obtain speedups in parametric yield estimation from 2times to 50times
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