Abstract
New technology, the ultra stable low-noise current amplifier and the electron pump, provide new methods for making traceable measurements of small DC electric currents. We review four traceability routes for small current measurements and discuss the merits of each one. We present three case studies of small current calibrations, highlighting the role of noise and drifting instrument offsets. We show how the Allan deviation is used as a statistical tool for designing a calibration cycle to correctly eliminate drifting instrument offsets from calibration data. We also present a simplified noise model for a low-current ammeter which predicts a lower limit to the achievable statistical uncertainty in a calibration.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
