Abstract
The nonmonotonic dependence of the work function of ytterbium nanofilms deposited on singlecrystal Si(111) on their thickness is experimentally revealed and studied. This dependence is shown to be caused by electron density oscillations in the films (Friedel oscillations), which are generated by the ytterbium-silicon interface. These oscillations originate, in turn, from appreciable charge transfer from the ytterbium film having a low work function to silicon.
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