Abstract
We present a simple method to calibrate frictional force from lateral force and topographic images using a commercial scanning probe microscope. A standard sample of Si grating and commercial Si cantilever were used in this study. We have measured the frictional force between the Si tip and functionalized multi-wall carbon nanotube bundles using our calibration method.
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Schedule a callMore From: Colloids and Surfaces A: Physicochemical and Engineering Aspects
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