Abstract
Atomic force microscopy (AFM) is an analytical nanotechnology in friction determination between microscale and nanoscale surfaces. AFM has advantages in mechanical measurement, including high sensitivity, resolution, accuracy, and simplicity of operation. This paper will introduce the principles of mechanical measurement by using AFM and reviewing the progress of AFM methods in determining frictions in the field of biochemical science over the past decade. While three friction measurement assays—friction morphology, friction curve and friction process in experimental cases—are mainly introduced, important advances of technology, facilitating future development of AFM are also discussed. In addition to the principles and advances, the authors also give an overview of the shortcomings and restrictions of current AFM methods, and propose potential directions of AFM techniques by combining it with other well-established characterization techniques. AFM methods are expected to see an increase in development and attract wide attention in scientific research.
Highlights
Atomic force microscopy(AFM) is an analytical technology based on the interaction between surfaces and the tip at a single molecule level
While friction force and frictional properties of samples were previously measured by other methods, AFM was commonly used to characterize thickness, morphology [15,16,17], roughness [15,18,19,20] and surface characterization
This article summarizes the progress of AFM over the past decade as a measurement tool for frictional characteristics in the field of biochemical science
Summary
Atomic force microscopy(AFM) is an analytical technology based on the interaction between surfaces and the tip at a single molecule level. AFM can be widely applied for the measurement of mechanical, electrical and magnetic properties of chemicals at the nanoscale [8,9,10]. AFM has been widely applied for measurement of sample morphology and atomic forces, especially longitudinal forces. While friction force and frictional properties of samples were previously measured by other methods, AFM was commonly used to characterize thickness, morphology [15,16,17], roughness [15,18,19,20] and surface characterization.
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