Frequency-dependent exchange bias in NiFe/NiO films

Abstract

Ferromagnetic (FM) resonance and magnetization curve measurements were performed at room temperature for a polycrystalline ${\mathrm{Ni}}_{81}{\mathrm{Fe}}_{19}$ coupled to NiO. It was observed that the shape of the angular variation of the resonance field is frequency dependent, with the curve at 9.65 GHz typical for a strongly exchange-coupled bilayer, while the 34.0 GHz curve is characteristic for relatively weak interactions. Numerical simulations of the resonance field and of the hysteresis loop shift, carried out through the domain wall formation model, as well as the resonance linewidth data indicated that there must be two fractions in the antiferromagnetic part of the interface, with stable and unstable grains. Only the stable grains contribute to the exchange bias. In our sample, whether an interfacial antiferromagnetic grain is stable or not is predominantly determined by the strength of the exhange coupling between this grain and the adjacent FM domain. The stable antiferromagnetic grains, whose contribution is sensed by the resonance experiment, are the smaller ones, which are more strongly coupled to the ferromagnet than the larger grains.