Abstract
ABSTRACTPolarization and polarization fatigue of PZT and other ferroelectric thin films have been studied via the frequency spectra of D-E hysteresis. The coercive field (Ec) of PZT thin films has been found strongly dependent on the measuring frequency, while a relatively flat frequency response is observed with SrBi2Nb2O9 thin films. The different fatigue behavior can be attributed to such a difference in the frequency response. Physical models have been suggested to for domain wall movement in PZT and SrBi2Nb2O9 thin films. Based on these observations, a methodology has been proposed to evaluate the high frequency and fatigue properties of ferroelectric thin films.
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