Frequency shifts in crystal resonators due to intrinsic stresses in unequal thickness electrodes

Xiaomeng Yang Xiaomeng Yang,J.A Turner,Jiashi Yang Jiashi Yang,J.A Kosinski

doi:10.1109/freq.2004.1418483

Frequency shifts in crystal resonators due to intrinsic stresses in unequal thickness electrodes

Xiaomeng Yang Xiaomeng Yang, J.A Turner + Show 2 more

https://doi.org/10.1109/freq.2004.1418483

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Publication Date: Aug 23, 2004

Citations: 6

Affiliation: University of Nebraska–Lincoln, United States Army Combat Capabilities Development Command, United States Army

#Frequency Shifts In Resonators #Frequency Shifts + Show 8 more

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Abstract

We study frequency shifts in crystal resonators due to intrinsic stresses from electrodes with different thickness. The first-order perturbation integral, as developed by Tiersten for frequency shifts in resonators, is used. Frequency shifts in rotated Y-cut quartz thickness-shear resonators are calculated. The effect of asymmetric electrodes is examined.

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