Abstract
In this paper the frequency response shift and hysteresis suppression of contact-mode atomic force microscopy is investigated using parametric modulation of the contact stiffness. Based on the Hertzian contact theory, a lumped single degree of freedom oscillator is considered for modeling the cantilever dynamics contact- mode atomic force microscopy. We use the technique of direct partition of motion and the method of multiple scales to obtain, respectively, the slow dynamic and the corresponding slow flow of the system. As results, this study shows that the amplitude of the contact stiffness modulation has a significant effect on the frequency response. Specifically, increasing the amplitude of the stiffness modulation suppresses hysteresis, decreases the peak amplitude and produces shifts towards higher and lower frequencies.
Highlights
In atomic force microscopy (AFM) [1], a micro-scale cantilever beam with a sharp tip is employed to scan the topography of a specimen surface
Based on the Hertzian contact theory, a lumped single degree of freedom oscillator is considered for modeling the cantilever dynamics contactmode atomic force microscopy
This study shows that the amplitude of the contact stiffness modulation has a significant effect on the frequency response
Summary
In atomic force microscopy (AFM) [1], a micro-scale cantilever beam with a sharp tip is employed to scan the topography of a specimen surface. For a slight increase of the amplitude of the harmonic excitation, contact losses occur near resonances and followed by a succession of impacts causing the deterioration of the device [2]. It was concluded that a fast harmonic base displacement causes the resonance curves to shift left, whereas the rapidly parametric stiffness shifts them right, offering thereby a method for controlling contact losses and impact trigging in the system. The present work is focused on the effect of contact stiffness vibration of a contact-mode AFM on the frequency response, and contact losses This parametric vibrations in a Hertzian contact-mode AFM can be excited, for instance, by laterally vibrating the cantilever at its clamped end or by modulation of the Hertz coefficient which may be caused when the tip is scanning along certain directions [7].
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
