Abstract
In this paper, we discuss torsional resonance mode atomic force microscopy in frequency modulation (FM-TR-AFM) under ambient conditions. Freshly cleaved chlorite (001) exhibiting brucite-like and mica-like surface areas was investigated in constant amplitude operation in order to visualize topography and frictional properties. The measurements in frequency modulation allow the characterization of dissipative effects due to changes in the lateral forces between tip and sample.
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