Abstract
Abstract It is shown that when the frequency of incident X-rays is tuned just below an absorption edge of a particular element in a multi-element sample, the derivative of the scattered intensity with respect to the frequency of the X-rays is dominated by the interference of X-rays about this element. Frequency modulated X-ray diffraction should permit certain partial structure factors to be determined simply with a sensitivity orders of magnitude greater than techniques used previously. This technique should yield at least the same information that X-ray absorption (EXAFS) techniques are supposed to provide, but with fewer complications.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
