Abstract

Frequency entangled biphoton sources have played an important role in quantum information. There are two key characteristics which determine the extent of their applications: the spectral indistinguishability and the degree of frequency entanglement. Previously, the spectral indistinguishability of the biphoton state is measured by the Hong–Ou–Mandel (HOM) interference visibility, whereas the degree of frequency entanglement is normally characterized with independent spectral measurements. However, these two quantum features have not been successfully measured with a single experimental setup. In this paper, we deduce the temporal distribution of a short-pulse pumped type-II spontaneous parametric down converted (SPDC) biphoton source and its relevant temporal entanglement parameter Rt for operationally quantifying the degree of frequency entanglement. Furthermore, we theoretically and experimentally demonstrate, due to the inherent group delay, the difference between the signal and idler photons at the exit of the type-II nonlinear crystal, resulting in a HOM-shape dip at both sides of the center fringed envelope of the MZ interferometric coincidence diagram. By measuring the HOM-shape dip depth, the separation between the two sideband dips as well as the MZ fringed envelope width, both the spectral indistinguishability and the temporal entanglement parameter can thus be simultaneously quantified. This implementation provides us a unified and convenient method to characterize the frequency entanglement of the short-pulse pumped biphotons.

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