Abstract

Linear polarization angle, θ, dependent measurements of the microwave radiation-induced oscillatory magnetoresistance, Rxx, in high mobility GaAs/AlGaAs 2D electron devices have shown a θ dependence in the oscillatory amplitude along with magnetic field, frequency, and extrema-dependent phase shifts, θ0. Here, we suggest a microwave frequency dependence of θ0(f) using an analysis that averages over other smaller contributions, when those contributions are smaller than estimates of the experimental uncertainty.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call