Abstract
Frequency dependent optical and dielectric properties for several grades of chemical vapor deposited (CVD) zinc sulfide (standard, elemental, and multi-spectral) was performed using a terahertz time-domain spectroscopy (THz-TDS) system in the frequency range from 0.15THz to 2.5THz. Zinc sulfide exhibits low frequency vibrational modes characterized by the THz-TDS. Two low-frequency phonon resonance lines were revealed at 0.78THz and 2.20THz. These samples were also characterized in the GHz range using a backward wave oscillator (BWO) source quasi-optical spectrometer, and the data obtained by both approaches were compared. Experimental data were also compared with an undamped harmonic oscillator model. These results compare well with the literature values obtained using other methods.
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