Frequency dependent FMR studies on pulsed laser ablated YIG films deposited on (111) GGG substrate

Abstract

Ferromagnetic Resonance (FMR) studies were carried out as a function of frequency on ex-situ post-annealed (Ta: 700 °C and 850 °C) YIG films. The films were deposited at TS: 750 °C on polished single crystal (111) GGG substrate using pulsed laser deposition. Both the films (Ta: 700 °C, 850 °C) shows a in-plane FMR line-width (ΔH) of 40 Oe and 50 Oe respectively which remains constant over a broad frequency range (8 GHz-20 GHz). On the other hand, a linear increment in in-plane resonance field (HR) has been observed with the increase in frequency of RF signal. The effective saturation magnetization (4πMeff) has been estimated for both the films using Kittel's equations and is found as 90% of the bulk value for the film deposited at 750 °C, annealed at 700 °C.