Abstract
In this work, the electric and dielectric properties of nanocrystalline SnO 2 thick films were studied using ac impedance spectroscopy under different conditions through capacitance–frequency measurements in frequency range from 1 Hz to 1 MHz and bias voltage range from 0 V to 2 V. Results showed that dielectric constant ( ɛ′), dielectric loss ( ɛ″), loss tangent (tan δ), ac electrical conductivity ( σ) and the electric modulus ( M) are strongly frequency dependent. A decrease in frequency accompanied with an increase in ɛ′ and ɛ″ values. Whereas, ac electrical conductivity ( σ), real ( M /) and imaginary parts of electric modulus ( M //) values are increased with frequency increasing. A comparative study showed that our prepared thick films have greater dielectric value than that of the reported data; hence can be used them as ultrahigh dielectric materials.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
