Abstract
In this paper, the free vibration of a functionally-graded piezoelectric semiconductor (FGPS) rectangular beam under thermal load is studied within the framework of the theory of Timoshenko beam and the theory of piezoelectric semiconductor. It is assumed that the material properties in the functional gradient layer change smoothly. The multi-field coupling in the beam is deduced by introducing the first-order shear deformation theory in this paper, and the governing equations including motion equation, Gauss law and current continuity condition are obtained. The vibration of a simply supported FGPS rectangular beam is realized by solving the governing equations. In numerical examples, the natural frequencies of the FGPS rectangular beam under thermal load are analyzed through different perspectives. The results show that for different length scales, the natural frequency of the FGPS beam under thermal load is reduced by increasing the initial electron concentration in a certain range. The damping characteristics are insensitive to temperature change, and the damping characteristics are decreased by increasing length to thickness ratio and the thickness of the FGPS layer.
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