Abstract

Abstract A method based on fracture mechanics rather than on the measurement of the refractive index and birefringence profiles, which determines stress profiles in NaK ion-exchanged soda-lime glass waveguides is presented and discussed. With this technique the stress profile is obtained by measuring the surface stress field by Vickers indentations on waveguides which are progressively HF leached, and the profile is subsequently corrected by considering successive reductions in the thickness.

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