Abstract
Low-frequency Raman spectroscopy is used to study the sensitivity of the dynamic (vibrational) properties of the fractal structure of nanocracks in vitreous SiO2 to the mechanical and thermal previous history of the sample. The material is obtained by vacuum-compression fritting of the sol-gel synthesis products. After fritting, continuity defects having a nanostructural scale and possessing fractal geometry are left at the site of microcracks in the course of preliminary mechanical processing of the sample. The features of such defects are an absence of the boson peak in the Raman spectrum and a monotonic decrease of the intensity according to the law of light scattering from acoustic vibrations of fractals. The conditions for the emergence of the fractal structure and its dependence on the rigidity of the walls of nanocracks are determined from the scattering mode.
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