Abstract
The method of Heun's differential equation is demonstrated in studying a fractional linear birth-death process (FLBDP) with long memory described by a master equation. The exact analytic solution of the generating function for the probability density is obtained on the basis of Heun's differential equation. The multi-fractal nature of FLBDP associated with long memory is demonstrated in conjunction with the present simple birth death process. Finally, the subtle multi-fractal nature of critical fluctuations under long memory is also displayed in the present FLBDP. Further, discussions are also given on the features of transient fluctuation in systems with long memory.
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