Abstract

Pull-in instability was an important phenomenon in microelectromechanical systems (MEMS). In the past, MEMS were usually assumed to work in an ideal environment. But in the real circumstances, MEMS often work in dust-filled air, which is equivalent to working in porous media, that's mean fractal space. In this paper, we studied MEMS in fractal space and established the corresponding model. At the same time, we can control the occurrence time and stable time of pull-in by adjusting the value of the fractal index, and obtain a stable pull-in phenomenon.

Highlights

  • In recent years, Microelectromechanical systems (MEMS) has received extensive attention from scientific researchers

  • We explored its impact on pull-in by selecting different fractional derivatives, and realized the effective control of timing for pull-in occurrence, and obtain a stable pull-in condition

  • It can be seen that the fractal model of MEMS we have established can control the occurrence time of pull-in and the stable time by adjusting the value of the fractional index

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Summary

Introduction

Microelectromechanical systems (MEMS) has received extensive attention from scientific researchers. The MEMS we consider are in a smooth medium, which can be called a continuous space. It will inevitably affect the work of electronic devices, and affect the pull-in. In this case, we need to analyze MEMS in fractal space.

Results
Conclusion
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