Abstract
The centerline streamwise and cross-sectional (x/Dh = 0.425) turbulence characteristics of a 2D planar space-filling square-fractal-grid (SFG) composed of self-similar patterns superimposed at multiple length-scales is experimentally unveiled via piezoelectric thin-film flapping velocimetry (PTFV). The fluid–structure-interaction between a flexible piezoelectric thin-film and SFG-generated turbulent flow at ReDh = 4.1 × 104 is investigated by analysis of the thin-film’s mechanical response. Measurements of the thin-film-tip deflection δ and induced voltage V demonstrate increasing flow fluctuation strength in the turbulence generation region, followed by rapid decay further downstream of the SFG. Interestingly, SFG-induced turbulence enables the generation of maximum centerline thin-film’s response (Vrms, δrms) and millinewton turbulence-forcing (turbulence-induced excitation force acting on the thin-film) Frms which are respectively, 7× and 2× larger than the classical square-regular-grid of similar blockage ratio. The low frequency, large-scale energy-containing eddies at SFG’s central opening plays a critical role in driving the thin-film vibration. Most importantly, the SFG-generated turbulence at (y/T = 0.106, z/T = 0.125) away from the centerline allows equivalent mechanical characteristics of turbulence generation and decay, with peak of 1.9× nearer from grid. In short, PTFV provides a unique expression of the SFG-generated turbulence, of which, the equivalent turbulence length-scale and induced-forcing deduced could aid in deciphering the flow dynamics for effective turbulence management.
Highlights
The centerline streamwise and cross-sectional (x/Dh = 0.425) turbulence characteristics of a 2D planar space-filling square-fractal-grid (SFG) composed of self-similar patterns superimposed at multiple length-scales is experimentally unveiled via piezoelectric thin-film flapping velocimetry (PTFV)
The expression of local equivalent fluid flow undulation and the corresponding turbulence forcing via an in-house established system, namely, the piezoelectric thin-film flapping velocimetry (PTFV) to comprehend the fundamental turbulence and the strength of grid-generated flow
The present experimental study was set out to explore the mechanical characteristics of fractal grid-generated turbulence based upon the direct fluid–structure interaction between the flow and a flexible piezoelectric thinfilm
Summary
The centerline streamwise and cross-sectional (x/Dh = 0.425) turbulence characteristics of a 2D planar space-filling square-fractal-grid (SFG) composed of self-similar patterns superimposed at multiple length-scales is experimentally unveiled via piezoelectric thin-film flapping velocimetry (PTFV). The fluid–structure-interaction between a flexible piezoelectric thin-film and SFG-generated turbulent flow at ReDh = 4.1 × 1 04 is investigated by analysis of the thin-film’s mechanical response. Measurements of the thin-film-tip deflection δ and induced voltage V demonstrate increasing flow fluctuation strength in the turbulence generation region, followed by rapid decay further downstream of the SFG. When immersed in a fractal grid-induced flow domain, the random vortical structures shed from the grid bars will impart a mechanical strain on the piezoelectric to generate electrical charges as a function of fluid fluctuating properties. The fractal grid-generated turbulence force acting on a flexible piezoelectric thin-film has yet to be unravelled
Sign-in/Register to view highlights & summary Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
