Abstract
The fractal formation and V–I behavior of the Au/Ge bilayer film have been investigated with a transmission electron microscope and by the two-probe configuration method. The experimental results suggest that the Au/Ge bilayer film, after the fractal crystallization, shows a nonlinear V–I behavior. This phenomenon was explained by the random tunneling junction model.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
