Abstract

Currently, the minimum feature size fabricated is about 15–40 nm. The resolution of Fresnel zone plates is limited by the width of the outermost zone. Although the photon sieves make it possible to focus soft X-rays to spot sizes smaller than the diameter of the smallest pinhole they have low diffraction efficiency. In order to foster strengths and circumvent weaknesses of them, we propose a new model which is composed of Fresnel zone and pinholes and give its fast Fourier algorithm. The simulation results demonstrate that the resolution of photon sieves is not better than that of Fresnel zone plates in low order of local rings. In this case, we can substitute pinholes for Fresnel zone in photon sieves. Resolution is nearly a constant, and also the diffraction efficiency improves.

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