Fourier transform profilometry (FTP) using an innovative band-pass filter for accurate 3-D surface reconstruction

Abstract

This article presents a novel band-pass filter for Fourier transform profilometry (FTP) for accurate 3-D surface reconstruction. FTP can be employed to obtain 3-D surface profiles by one-shot images to achieve high-speed measurement. However, its measurement accuracy has been significantly influenced by the spectrum filtering process required to extract the phase information representing various surface heights. Using the commonly applied 2-D Hanning filter, the measurement errors could be up to 5–10% of the overall measuring height and it is unacceptable to various industrial application. To resolve this issue, the article proposes an elliptical band-pass filter for extracting the spectral region possessing essential phase information for reconstructing accurate 3-D surface profiles. The elliptical band-pass filter was developed and optimized to reconstruct 3-D surface models with improved measurement accuracy. Some experimental results verify that the accuracy can be effectively enhanced by using the elliptical filter. The accuracy improvement of 44.1% and 30.4% can be achieved in 3-D and sphericity measurement, respectively, when the elliptical filter replaces the traditional filter as the band-pass filtering method. Employing the developed method, the maximum measured error can be kept within 3.3% of the overall measuring range.