Fourier transform infrared study of pulsed laser deposited Fe[sub 3]O[sub 4] thin films grown on different substrates

Abstract

We present infrared (IR) measurements of Magnetite (Fe3O4) thin films grown on single crystal MgO and Si substrates by pulsed laser deposition (PLD). X-ray diffraction (XRD) pattern of the films suggested that the grown films are single phase and oriented in (100) and (111) directions on MgO (100) and Si (100) substrates respectively. Fourier transform infrared spectroscopy (FTIR) measurements show the presence of most intense T1u mode of Fe3O4 in both the films. Spectral parameters of T1u mode shows the variation in film grown on MgO substrate while same on Si when compared with bulk Fe3O4. The observed difference in mode parameters is correlated with presence of antiphase boundaries in film grown on MgO substrate.