Four-parameter model of thin surface layer contribution to reflectance-absorbance spectroscopy and ellipsometry.

Abstract

The contribution of the surface layer to the reflection coefficients is shown to be determined by four surface integral values, which can be interpreted as real and imaginary parts of two complex permittivity excesses. The reflectance-absorbance spectra are determined by the spectra of these parameters. The spectra of the surface excess integrals cannot be found with the angular measurements of reflection-absorption spectra, which are determined by only three angular dependent terms. To determine these four surface excess integrals, it is necessary to involve the experimental data of spectroscopic ellipsometry or polarization-modulation infrared reflection absorption spectroscopy providing equivalent information about surface. In the case of weakly absorbing bulk medium, the real parts of the excesses can be neglected, permitting calculation of their imaginary parts using the angular dependence of the absorbance. The calculation of these parameters allows to check consistency of the data obtained. Measurements of the angular dependence of the absorbance of p-polarized radiation reflected from the DPPC monolayer upon distilled water were performed. The data obtained turned to be in good agreement with the proposed theoretical analysis.