Abstract
An accurate technique for six-port reflectometers calibration is presented in this paper. The method based on a spatial Fourier analysis incorporates nonlinearity and mismatching effects as a part of the calibration procedure. The technique makes use of impedance data distributed on the whole Smith chart to increase the measurement accuracy. A straightforward least square algorithm is used to fully calibrate the six-port reflectometer. Experimental data in the millimeter-wave frequency range is provided to validate the technique.
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