Formation properties of an InGaN active layer for high-efficiency InGaN/GaN multi-quantum-well-nanowire light-emitting diodes

Abstract

Nitride-based nanowires (NWs) have several advantages, such as flexibility in choosing a substrate, easy fabrication, large light-emitting area, no internal electric field, enhanced light extraction, and reduced defects by strain relief, that are useful for enhancing the efficiency of light-emitting diodes (LEDs). Here, we report how crucial the formation properties of the InGaN active layer are for enhancing the efficiency of core-shell InGaN/GaN multi-quantum-well (MQW)-NW LEDs that are selectively grown on oxide templates with perfectly-circular hole patterns. The nanostructures are analyzed for two types of LEDs, one containing defect-free MQW active layer and the other containing MQW layer with defects by using high-resolution transmission electron microscopy. The I-V curve of the defect-free LED shows a rectifying behavior with an on/off ratio of ~109, typical of a diode, and the off-state leakage current of the LED with defects is much larger than that of the defect-free LED, resulting in brighter electroluminescence from the latter device. These results suggest that well-defined nonpolar InGaN/GaN MQW-NWs can be utilized for the realization of high-performance LEDs.