Abstract

Processes of electron-diffraction structure analysis have been used to study the processes of phase formation and phase transitions in thin layers of a Ag-In-Se system. The phases formed at the onset of interaction between the films and phase transformations occurring during annealing of the samples in vacuum are established. It is found that thin films of the AgInSe2 compound formed as a result of simultaneous or consecutive deposition of components are amorphous, and crystallization brings about the formation of textured films with high structural quality

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