Abstract
Microcrystalline lead sulfide (PbS) films were synthesized using the chemical deposition method. The films were deposited on pre-cleaned glass substrates and polished silicon wafers. Chemicals of high purity were utilized in the process. The morphology, composition, and structure of the films were characterized using scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDS), and X-ray diffraction (XRD). The films exhibited a galena phase with a face-centered cubic structure belonging to the Fm-3m space group. The average grain size was determined using the WilliamsonHall method, revealing a homogenous structure. Raman spectroscopy further confirmed the structural integrity of the films. The obtained results contribute to the understanding of the synthesis and properties of microcrystalline PbS films.
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