Abstract
Former transmission electron microscope (TEM) studies /1,2,3/ on Cu and Au foils, which were bombarded with 1 to 5 keV Ar ions, showed that interstitial clusters (in the configuration of Frank dislocation loops) are formed below the bombarded surface in a depth remarkably larger than the calculated random range of Ar ions. This was interpreted by the propagation of focussing replacement collision sequences (r.c.s.) originating near the end of the heavily damaged layer within the random range of the incoming Ar ions. One of the strongest arguments in support of this interpretation was the dependence of the depth distributions of the interstitial agglomerates on the crystallographic orientation of the foil surface.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.