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Abstract
Crystalline and electronic structures of SiO2/Al2O3 mixtures have been analyzed using X-ray diffraction (XRD) and ultra-soft X-ray emission spectroscopy (USXES). Comparison of ultrasoft X-ray emission AlLα-, SiLα- and OKα-bands redistribution Alsp-, Sisp- and Op-valence electrons when changing the mass ratio (0,23Al2O3+0,77 SiO2;, 0,30Al2O3+0,70SiO2; 0,75Al2O3+25 SiO2) and depending on the method of obtaining them. Expansion OKα-emission bands showed an increase in population of Opπ-levels of oxygen in the formation of pyrogenic composites with different contents of aluminum oxide and silicon dioxide. Analysis AlLα-, SiLα- emission bands allowed to explain the increase of population Opπ-levels of oxygen and present the morphology formation of particles different of pyrogenic composites during synthesis.
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