Abstract
Analysis is made of the formation of interference patterns in the cases of double-exposure recording of quasi-Fourier, Fourier holograms, and specklograms using a positive lens to control changes in the wave-front tilt. It is shown that the interference patterns are localized in the far diffraction zone and the interferometer sensitivity depends on the scale in the planes of a hologram or a specklogram of the Fourier transform of the function characterizing the complex transmittance or reflection amplitudes of a diffusively scattering flat surface. The experimental results are in good agreement with theory.
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