Abstract
Domain structures in the 16×2 reconstructed surfaces of Si(110) are studied by scanning LEED microscopy for vicinal surfaces with different off-angles from the exact plane. Mixed domains with two different orientations are observed in the low off-angle surfaces, but a single domain appears in the high off-angle surfaces. The domain size is several hundred μm in length along 〈¯112〉 or 〈¯112〉 with a width of several μm to several tens of μm. From the result, it is 0155 concluded that formation of domain structure in the reconstructed surface is not caused by bulk structure, but is related to the off-angle of the surface.
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