Abstract
Chromium conversion coating (CCC) formation was monitored on copper‐containing aluminum alloys AA2024-T3 and a specially cast ingot using Raman spectroscopy of the band. The ingot's different phases were compositionally analyzed with energy‐dispersive spectroscopy (EDS) and Auger electron spectroscopy (AES) before and after treatments using commercial Alodine™ 1200S chromium solution. Profilometry and Raman intensity of the band were used to gauge CCC film thickness on AA-2024-T3 alloy. A linear relationship between CCC thickness and the integrated band was shown to exist on AA-2024 alloy. Raman intensity of the band was also integrated and spatially mapped using commercially available software. These results were verified with AES depth profiling using an ion sputter. CCC formation was found to be slower on the phases with higher copper content. Similarly, in 2024-T3, CCC formation was suppressed on S‐phase and “depressed” intermetallics of 2024 aluminum alloy. adsorption on the ingot phases, Cu, Al, Mg, and AA2024-T3 were characterized by Raman in the range. © 2000 The Electrochemical Society. All rights reserved.
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